Ionscope headquartered in Cambridge UK, is the world-leader in Scanning Ion Conductance Microscopy (SICM), a rapidly emerging Scanning Probe Microscopy (SPM) technique which not only allows nanoscale topographical mapping of soft and delicate surfaces, but also enables precise positioning of a probe to a specific spot on the sample surface for further manipulations.

Based on a successful research and development program at Imperial College London and the University of Cambridge, IonscopeTM SICM was commercialised first in 2004.  Ionscope’s SICM has been installed in labs worldwide in Asia, North America and Europe to help researchers with new discoveries.