Ionscope headquartered in Cambridge UK, is the world leader in Scanning Ion Conductance Microscopy (SICM), a rapidly emerging Scanning Probe Microscopy (SPM) technique which allows nanoscale topographical mapping of soft and delicate surfaces.
Based on a successful research and development programme at Imperial College London and the University of Cambridge, Ionscope was founded originally in 2004. Ionscope’s SICM is installed in labs world widely in Asia, America, Europe and Australia to help researchers with new discoveries.